Park Systems Launches NX1: The Highest Resolution AFM for Atomic-Scale Imaging in Ambient Conditions | The AI Journal
Park Systems Launches NX1: The Highest Resolution AFM for Atomi…
2 weeks ago
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We are excited to announce that Park Systems has just launched Park SmartAnalysis, the next generation AFM Image Analytics Software. Park SmartAnalysis includes powerful features and newly added automated functions to boost your productivity. It enables users to swiftly process, analyze and publish their AFM data. Key Features & Functions: ✔ Precise image analysis via multi-layer and line function ✔ Effortless image processing with EZ Flatten producing optimal images ✔ High-quality 2D, 3D images
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We are excited to announce that Park Systems has just launched P…
326.3K viewsSep 7, 2022
FacebookPark Systems
Introducing Park FX40, the new autonomous next-gen AFM infused with innovative robotics, intelligent learning features, safety mechanisms, AI-based software and specialized add-ons designed to boost your nano-research effortlessly. ⏩Learn more on Park FX40 website: https://parksystems.com/products/small-sample-afm/park-fx40 🎦Watch the FX40 Product video: https://www.youtube.com/watch?v=uYdQ4hWZ92I&t=1s #FX40 #AFM #gamechanger #AI #innovation #future #newera #nanoscience #nanotechnology | Park S
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Introducing Park FX40, the new autonomous next-gen AFM infuse…
16.4K viewsJul 14, 2021
FacebookPark Systems
Park NX-Wafer is a revolutionary AFM solution designed for bare wafer manufacturing that fully automates the defect review process and increases production throughput by an astounding 1,000%. Discover unique application capabilities of the Wafer Series with automatic defect review (ADR), low noise atomic force profiler for accurate, high throughput CMP profile measurements, and sub-angstrom surface roughness measured with extreme accuracy and minimized tip-to-tip variation. Learn more: https://p
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Park NX-Wafer is a revolutionary AFM solution designed for bare w…
64.4K viewsJul 28, 2021
FacebookPark Systems
BREAKING NEWS: Introducing Park NX-Hybrid WLI - the first-ever AFM with built-in WLI profilometry for semiconductor and related manufacturing quality assurance, process control for semiconductor front-end, back-end up to advanced packaging, and R&D metrology. It is for those that require high throughput measurements over a large area that can zoom down to nanometer-scale regions with sub-nano resolution and ultra-high accuracy. Learn more: https://parksystems.com/products/industrial/industrial-a
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BREAKING NEWS: Introducing Park NX-Hybrid WLI - the first-ever AF…
163.9K viewsNov 15, 2021
FacebookPark Systems
At Park Systems, we are dedicated to maximizing the impact of Atomic Force Microscopy (AFM) by eliminating the complexity encountered when using traditional setups. Our FX40 Automatic AFM has built-in robotics and intelligent scan algorithms for automated nanoscale imaging. 💡Got curious? 👉Follow us to learn more about the repeatable, hassle-free nano-characterization | Park Systems
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At Park Systems, we are dedicated to maximizing the impact of Atomi…
292.2K views5 months ago
FacebookPark Systems
Park #FX40 - the Automatic Atomic Force Microscope. Learn more about the first AFM to automatically execute all up-front set up and scanning processes, putting the intelligent Park FX40 in a groundbreaking new class of atomic force microscopes. FX40 allows you to get the sharpest, clearest, highest resolution images one sample after another on multiple applications. ⬇Download the Brochure: https://okt.to/TMpCOI 🎦Watch the Product Video: https://okt.to/kHOnUz #FX40 #AFM #gamechanger #AI #innovat
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Park #FX40 - the Automatic Atomic Force Microscope. Learn more ab…
241.2K viewsJan 4, 2022
FacebookPark Systems
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[𝗣𝗮𝗿𝗸 𝗞𝗻𝗼𝘄𝗹𝗲𝗱𝗴𝗲 𝗖𝗲𝗻𝘁𝗲𝗿] 𝗛𝗼𝘄 𝗔𝗙𝗠 𝘄𝗼𝗿𝗸𝘀: 𝗣𝗶𝗻𝗣𝗼𝗶𝗻𝘁™ 𝗡𝗮𝗻𝗼𝗺𝗲𝗰𝗵𝗮𝗻𝗶𝗰𝗮𝗹 In this episode, we introduce Park Systems’ 𝗣𝗶𝗻𝗣𝗼𝗶𝗻𝘁 𝗺𝗼𝗱𝗲 that use…
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Tired of manual setup of your nanocharacterization tools? Park …
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