Dual-frequency resonance tracking (DFRT) is a technique that utilizes contact mode atomic force microscopy (AFM) to measure a sample’s weak electrical or mechanical responses. Conventional resonance ...

Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

Download this article in PDF format. Jacques and Pierre Curie, French physics, discovered the piezoelectric effect in 1880. When some solid material is mechanically compressed or stressed, the ...

This file type includes high resolution graphics and schematics when applicable. Generating a high-frequency magnetic field can be quite a challenge due to an assortment of technical issues. At high ...